Theses most similar to those of author Alam, Syed Mohiul, 1975-

ERNI-3D : a technology-generic tool for interconnect reliability projections in 3D integrated circuits (2001) read it

Development of an architectural design tool for 3-D VLSI sensors

Tyrrell, Brian (Brian Matthew) (2004)

  • Advisors: L. Rafael Reif; Robert K. Reich
  • Department of Electrical Engineering and Computer Science
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Design of a 3-dimension FPGA

Lajevardi, Payam (2005)

  • Advisor: Anantha P. Chandrakasan
  • Department of Electrical Engineering and Computer Science
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An integrated associative processing system

Herrmann, Frederick P. (Frederick Paul) (1994)

  • Advisor: Charles G. Sodini
  • Department of Electrical Engineering and Computer Science
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VLSI design for freshmen and sophomores

Harris, David (1994)

  • Advisor: William J. Dally
  • Department of Electrical Engineering and Computer Science
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Microprocessor energy characterization and optimization through fast, accurate, and flexible simulation

Krashinsky, Ronny (Ronny Meir), 1978- (2001)

  • Advisor: Krste Asanović
  • Department of Electrical Engineering and Computer Science
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CAD for a 3-dimensional FPGA

Chandrasekhar, Vikram (2007)

  • Advisors: Anantha P. Chandrakasan; Donald E. Troxel
  • Department of Electrical Engineering and Computer Science
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Circuit designs for the MAP chip

Chen, Andrew R. (Andrew Raymond) (1997)

  • Advisor: William J. Dally
  • Department of Electrical Engineering and Computer Science
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Floating-point unit (FPU) designs with nano-electromechanical (NEM) relays

Dutta, Sumi (2013)

  • Advisor: Vladimir Stojanovic
  • Department of Electrical Engineering and Computer Science
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Use of high-level design information for enabling automation of fine-grained power gating

Agarwal, Abhinav (2014)

  • Advisor: Arvind
  • Department of Electrical Engineering and Computer Science
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Design tool and methodologies for interconnect reliability analysis in integrated circuits (2004) read it

System-level performance evaluation of three-dimensional integrated circuits

Rahman, Arifur, 1970- (2001)

  • Advisor: L. Rafael Reif
  • Department of Electrical Engineering and Computer Science
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New methodologies for interconnect reliability assessments of integrated circuits

Hau-Riege, Stefan P. (Stefan Peter), 1970- (2000)

  • Advisor: Carl V. Thompson, II
  • Department of Materials Science and Engineering
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Effects of mechanical properties on the reliability of Cu/low-k metallization systems

Wei, Frank L. (Frank Lili), 1977- (2007)

  • Advisor: Carl V. Thompson, II
  • Department of Materials Science and Engineering
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Reliability of copper interconnects in integrated circuits

Choi, Zung-Sun (2007)

  • Advisor: Carl V. Thompson, II
  • Department of Materials Science and Engineering
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