Theses most similar to those of author Srikar, V. T. (Vengallatore Thattai), 1972-

Electromigration behavior and reliability of bamboo Al(Cu) interconnects for integrated circuits (1999) read it

  • Advisor: Bernhardt J. Wuensch
  • Department of Materials Science and Engineering
  • Advisor: L. Rafael Reif
  • Department of Electrical Engineering and Computer Science
  • Advisor: Clifton G. Fonstad, Jr.
  • Department of Electrical Engineering and Computer Science
  • Advisors: Jagadeesh S. Moodera; Ronald M. Latanision
  • Department of Materials Science and Engineering
  • Advisor: Michael J. Demkowicz
  • Department of Materials Science and Engineering