Theses most similar to those of author Guo, Alex

Nano-scale metal contacts for future III-V CMOS (2012) read it

Vertically integrated transistors for field emission applications

Herz, Paul Richard, 1972- (2000)

  • Advisor: Akintunde Ibitayo (Tayo) Akinwande
  • Department of Electrical Engineering and Computer Science
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Advanced technologies for improving high frequency performance of AlGaN/GaN high electron mobility transistors

Chung, Jinwook W. (Jinwook Will) (2008)

  • Advisor: Tomás Palacios
  • Department of Electrical Engineering and Computer Science
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Design and characterization of Si/SiGe heterostructure sub-100 nm bulk p-MOSFET

Lee, Jae-ky (2009)

  • Advisor: Dimitri A. Antoniadis
  • Department of Electrical Engineering and Computer Science
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Hole mobility in strained Ge/relaxed SiGe with a High-k/metal gate stack

Polyzoeva, Evelina Aleksandrova (2011)

  • Advisor: Dimitri A. Antoniadis
  • Department of Electrical Engineering and Computer Science
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Fabrication and characterization of germanium-on-silicon photodiodes

DiLello, Nicole Ann (2012)

  • Advisor: Judy L. Hoyt
  • Department of Electrical Engineering and Computer Science
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Compressively strained Ge trigate p-MOSFETs

Chern, Winston (2012)

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Fabrication and testing of dual gate p-channel MOSFETs

Easley, Justin Lavaughn (2013)

  • Advisor: Marc A. Kastner
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Nano-scale ohmic contacts for III-V MOSFETs

Lu, Wenjie (2014)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Analysis of Mo sidewall ohmic contacts to InGaAs fins

Choi, Dongsung (2017)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Large scale applications of 2D materials for sensing and energy harvesting

McVay, Elaine D (2017)

  • Advisor: Tomás Palacios
  • Department of Electrical Engineering and Computer Science
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Bias temperature instability (BTI) in GaN MOSFETs (2016) read it

Degradation mechanisms of GaN high electron mobility transistors

Joh, Jungwoo (2007)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Electrical degradation mechanisms of RF power GaAs PHEMTs

Villanueva, Anita A. (Anita Ariel), 1978- (2007)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Dynamics of the kink effect in InAlAs/InGaAs/InP HEMTs

Ernst, Alexander N. (Alexander Nicolai) (1997)

  • Advisor: Jesus A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Hot-carrier reliability assessment in CMOS digital integrated circuits

Jiang, Wenjie, 1963- (1998)

  • Advisor: James E. Chung
  • Department of Electrical Engineering and Computer Science
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Reliability of GaN high electron mobility transistors on silicon substrates

Demirtas, Sefa (2009)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Physics of electrical degradation in GaN high electron mobility transistors

Joh, Jungwoo (2009)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors

Mertens, Samuel D. (Samuel David), 1975- (1999)

  • Advisors: Jesús A. del Alamo; Lawrence G. Studebaker
  • Department of Electrical Engineering and Computer Science
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Electrical reliability of RF power GaAs PHEMTs

Villanueva, Anita A. (Anita Ariel), 1978- (2003)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Degradation of GaN High Electron Mobility Transistors under high-power and high-temperature stress

Computer Science, fl. 2014-; Wu, Yufei. Department of Electrical Engineerin (2014)

  • Advisor: Jesus A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Dynamic ON-resistance in high voltage GaN field-effect-transistors

Jin, Donghyun (2014)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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