Theses most similar to those of author Perez, Ron M

Design of a three-axis micro-scale metrology system for the characterization of cylindrical flexures (2012) read it

Design and qualification of an absolute thickness measuring machine

Kelly, Darcy K. (Darcy Kendal), 1980- (2004)

  • Advisor: Nayfeh, Samir Ali, 1970-
  • Department of Mechanical Engineering
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Design of a novel six-axis metrology system for meso-scale nanopositioners

King, Ryan N. (Ryan Nicholas) (2009)

  • Advisor: Culpepper, Martin L. (Martin Luther)
  • Department of Mechanical Engineering
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Optical system for high-speed Atomic Force Microscope

Lim, Kwang Yon (2010)

  • Advisor: Dr. Kamal Youcef-Toumi
  • Department of Mechanical Engineering
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Designing, constructing, and testing an X-ray polarimeter

Jenks, Kevin P. (Kevin Patrick) (2011)

  • Advisor: Herman Marshall
  • Department of Mechanical Engineering
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Design, fabrication and implementation of a flexure-based micropositioner for Dip Pen Nanolithography

Thomas, Marcel A. C. (Marcel Adam Craig) (2012)

  • Advisor: Culpepper, Martin L. (Martin Luther)
  • Department of Mechanical Engineering
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Horizontal non-contact slumping of flat glass

Sung, Edwar (2013)

  • Advisor: Mark Schattenburg
  • Department of Mechanical Engineering
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