Theses most similar to those of author Jiang, Wenjie, 1963-

Hot-carrier reliability assessment in CMOS digital integrated circuits (1998) read it

Hot-carrier reliability of MOSFETs at room and cryogenic temperature

Kim, SeokWon Abraham, 1970- (1999)

  • Advisor: James E. Chung
  • Department of Electrical Engineering and Computer Science
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Hot-carrier reliability evaluation for CMOS devices and circuits

Chan, Vei-Han (1995)

  • Advisor: James E. Chung
  • Department of Electrical Engineering and Computer Science
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Modeling for hot-electron reliability simulation

Kim, SeokWon Abraham, 1970- (1995)

  • Advisor: James E. Chung
  • Department of Electrical Engineering and Computer Science
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The AlInP material system in heterojunction bipolar transistor technology

Yüksel, Ayça (1994)

  • Advisor: Leslie A. Kolodziejski
  • Department of Electrical Engineering and Computer Science
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Characterization of hot-carrier reliability in analog sub-circuit design

Le, Huy X. P (1996)

  • Advisor: James E. Chung
  • Department of Electrical Engineering and Computer Science
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Power limiting mechanisms in InP HEMTs

Putnam, Christopher S. (Christopher Stephen) (1997)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors

Mertens, Samuel D. (Samuel David), 1975- (1999)

  • Advisors: Jesús A. del Alamo; Lawrence G. Studebaker
  • Department of Electrical Engineering and Computer Science
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On the methodology of assessing hot-carrier reliability of analog circuits

Le, Huy X. P (1999)

  • Advisors: James E. Chung; Paul J. Marcoux
  • Department of Electrical Engineering and Computer Science
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InGaAs/GaAsSb quantum-well Tunnel-FETs for ultra-low power applications

Yu, Ta (2016)

  • Advisors: Dimitri A. Antoniadis; Judy L. Hoyt
  • Department of Electrical Engineering and Computer Science
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Bias temperature instability (BTI) in GaN MOSFETs

Guo, Alex (2016)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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