Theses most similar to those of author Cherkassky, Alexander (Alexander Peter), 1963-
Metrology of very thin silicon epitaxial films (1998) read it
Design, development and characterization of an integrated multispectral polarimetric sensor system
Kim, Dong-Hyun C. (Dong-Hyun Charles), 1969- (2001)
- Advisor: Cardinal Warde
- Department of Electrical Engineering and Computer Science
Wavelength dependence of the spectral linewidth of a grating-tuned CW single-frequency external-cavity strained quantum well InGaAs/AlGaAs Grinsch diode laser
Hsu, Long (1994)
- Advisor: Roshan L. Aggarwal
- Department of Physics
Femtosecond nonlinearities in AlGaAs diode laser amplifers
Hultgren, Charles T. (Charles Timothy) (1994)
- Advisor: Erich P. Ippen
- Department of Electrical Engineering and Computer Science
- Advisor: Fink, Yoel, 1966-
- Department of Materials Science and Engineering
- Advisor: Gang Chen
- Department of Mechanical Engineering
Optical characterization of complex mechanical and thermal transport properties
Johnson, Jeremy A. (Jeremy Andrew) (2011)
- Advisor: Keith A. Nelson
- Department of Chemistry
Piloting epitaxy with ellipsometry as an in-situ sensor technology
Warnick, Sean C. (Sean Charles) (2003)
- Advisor: Munther A. Dahleh
- Department of Electrical Engineering and Computer Science
- Advisors: Erich P. lppen; Franz X. Kärtner
- Department of Electrical Engineering and Computer Science
- Advisor: Keith A. Nelson
- Department of Physics
Optical transient grating measurements of micro/nanoscale thermal transport and mechanical properties
Eliason, Jeffrey Kristian (2015)
- Advisor: Keith A. Nelson
- Department of Chemistry