Theses most similar to those of author Maung, Tinaung Daniel
Statistical metrology of interlevel dieletric thickness (1995) read it
Fabrication of metallic nanostructures from sputtered nanocluster precursors
DelHagen, William S (2004)
- Advisor: Joseph Jacobson
- Department of Electrical Engineering and Computer Science
- Advisor: James E. Chung
- Department of Materials Science and Engineering
- Advisor: Donald S. Boning Duane S. Boning
- Department of Electrical Engineering and Computer Science
A statistical metrology framework for characterizing ILD thickness variation in CMP processes
Chang, Eric Choong-Yin (1996)
- Advisor: James Chung
- Department of Electrical Engineering and Computer Science
Using statistical metrology to understand pattern-dependent ILD thickness variation in oxide CMP processes
Divecha, Rajesh Ramji (1997)
- Advisor: Duane Boning
- Department of Electrical Engineering and Computer Science
Temperature effects on the electronic conductivity of single-walled carbon nanotubes
Mascaro, Mark Daniel (2007)
- Advisor: Francesco Stellacci
- Department of Materials Science and Engineering
Framework for characterization of copper interconnect in damascene CMP processes
Park, Tae Hong, 1973- (1998)
- Advisors: Duane Boning; James Chung
- Department of Electrical Engineering and Computer Science
Characterization and modeling of uniformity in chemical mechanical polishing
Oji, Charles (Charles Ojih), 1974- (1999)
- Advisors: Duane Boning; James Chung
- Department of Electrical Engineering and Computer Science
Extraction of variation sources due to layout practices
González-Valentín, Karen M. (Karen Mercedes), 1978- (2002)
- Advisor: Donald S. Boning Duane S. Boning
- Department of Electrical Engineering and Computer Science
Current limiters based on silicon pillar un-gated FET for field emission application
Niu, Yin (2009)
- Advisor: Akintunde Ibitayo (Tayo) Akinwande
- Department of Electrical Engineering and Computer Science