Theses most similar to those of author Hau-Riege, Stefan P. (Stefan Peter), 1970-
New methodologies for interconnect reliability assessments of integrated circuits (2000) read it
- Advisor: Carl V. Thompson, II
- Department of Civil and Environmental Engineering
Design tool and methodologies for interconnect reliability analysis in integrated circuits
Alam, Syed Mohiul, 1975- (2004)
- Advisors: Carl V. Thompson, II; Donald E. Troxel
- Department of Electrical Engineering and Computer Science
- Advisor: James E. Chung
- Department of Electrical Engineering and Computer Science
Effects of mechanical properties on the reliability of Cu/low-k metallization systems
Wei, Frank L. (Frank Lili), 1977- (2007)
- Advisor: Carl V. Thompson, II
- Department of Materials Science and Engineering
- Advisor: Carl V. Thompson, II
- Department of Materials Science and Engineering
Simulation of the effect of microstructure on electromigration induced failure of interconnects
Fayad, Walid R. (Walid Rahif) (1997)
- Advisor: Carl V. Thompson, II
- Department of Civil and Environmental Engineering