Theses most similar to those of author Stein, Andrew John, 1978-
A metrological atomic force microscope (2002) read it
MEMS structures for stress measurements for thin films deposited using CVD
Lau, Yu-Hin F. (Yu-Hin Felix) (2001)
- Advisor: Carl V. Thompson, II
- Department of Materials Science and Engineering
Design and use of a fixed-end low-load material testing machine
Ames, Nicoli M. (Nicoli Margret), 1978- (2000)
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Scanning probe microscopy with inherent disturbance suppression using micromechanical systems
Sparks, Andrew William, 1977- (2005)
- Advisors: Anne M. Mayes; Scott R. Manalis
- Department of Materials Science and Engineering
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- Department of Aeronautics and Astronautics
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- Department of Electrical Engineering and Computer Science
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- Department of Mechanical Engineering
Design and control methods for high-accuracy variable reluctance actuators
MacKenzie, Ian (Ross Ian) (2015)
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- Department of Mechanical Engineering
- Advisor: Dr. Kamal Youcef-Toumi
- Department of Mechanical Engineering