Theses most similar to Characterization and analysis of process variability in deeply-scaled MOSFETs (Balakrishnan, Karthi; 2012) read it
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Characterization of process variability and robust optimization of analog circuits
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- Department of Electrical Engineering and Computer Science
A test structure for the measurement and characterization of layout-induced transistor variation
Chang, Albert Hsu Ting (2009)
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- Department of Electrical Engineering and Computer Science
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- Department of Electrical Engineering and Computer Science
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Characterization and mitigation of process variation in digital circuits and systems
Drego, Nigel Anthony, 1980- (2009)
- Advisors: Anantha P. Chandrakasan; Duane Boning
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