Theses most similar to Temperature-dependent yield properties of passivated aluminum thin films on silicon wafers (Chu, Edison C. (Edison Chinghing); 1996) read it
- Advisor: L. Rafael Reif
- Department of Electrical Engineering and Computer Science
Molecular beam epitaxial growth and charcterization of mismatched InGaAs and InAlAs layers on InP
Bennett, Brian R. (Brian Robert) (1993)
- Advisor: Jesús A. del Alamo
- Department of Materials Science and Engineering
The effects of strain on carrier transport in thin and ultra-thin SOI MOSFETs
Lauer, Isaac, 1976- (2005)
- Advisor: Dimitri A. Antoniadis
- Department of Electrical Engineering and Computer Science
- Advisor: James E. Chung
- Department of Electrical Engineering and Computer Science
GeSi photodetectors and electro-absorption modulators for Si electronic-photonic integrated circuits
Liu, Jifen (2007)
- Advisor: Lionel C. Kimerling
- Department of Materials Science and Engineering
Anisotropic dewetting in ultra-thin single-crystal silicon-on-insulator films
Danielson, David T. (David Thomas) (2008)
- Advisor: Lionel C. Kimerling
- Department of Materials Science and Engineering
Relationships between grain structure and stress in thin Volmer-Weber metallic films
Leib, Jeffrey Scott (2009)
- Advisor: Carl V. Thompson, II
- Department of Materials Science and Engineering
Investigation of half-metallic ferromagnetism in NiMnSb spin dependent tunnel junctions
Tanaka, Clifford T. (Clifford Takashi) (1999)
- Advisors: Jagadeesh S. Moodera; Ronald M. Latanision
- Department of Materials Science and Engineering
The hydrogen-induced piezoelectric effect in InP HEMTs
Mertens, Samuel D. (Samuel David), 1975- (2003)
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science
Residual stresses and properties of layered and graded coatings
Kesler, Olivera E. (Olivera Elizabeth) (1999)
- Advisor: Subra Suresh
- Department of Materials Science and Engineering