Theses most similar to Electrical degradation mechanisms of RF power GaAs PHEMTs (Villanueva, Anita A. (Anita Ariel), 1978-; 2007) read it
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science
- Advisor: James E. Chung
- Department of Electrical Engineering and Computer Science
- Advisor: Leslie A. Kolodziejski
- Department of Electrical Engineering and Computer Science
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science
Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors
Mertens, Samuel D. (Samuel David), 1975- (1999)
- Advisors: Jesús A. del Alamo; Lawrence G. Studebaker
- Department of Electrical Engineering and Computer Science
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science
Degradation of GaN High Electron Mobility Transistors under high-power and high-temperature stress
Computer Science, fl. 2014-; Wu, Yufei. Department of Electrical Engineerin (2014)
- Advisor: Jesus A. del Alamo
- Department of Electrical Engineering and Computer Science
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science