Theses most similar to Degradation mechanisms of GaN high electron mobility transistors (Joh, Jungwoo; 2007) read it

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  • Department of Electrical Engineering and Computer Science
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Degradation of GaN High Electron Mobility Transistors under high-power and high-temperature stress

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Guo, Alex (2016)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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