Theses most similar to Hot-carrier reliability evaluation for CMOS devices and circuits (Chan, Vei-Han; 1995) read it
Hot-carrier reliability of MOSFETs at room and cryogenic temperature
Kim, SeokWon Abraham, 1970- (1999)
- Advisor: James E. Chung
- Department of Electrical Engineering and Computer Science
- Advisor: James E. Chung
- Department of Electrical Engineering and Computer Science
Vertical profile engineering and reliability study of silicon-germanium heterojunction bipolar transistors
Liao, Kenneth S. (Kenneth Sen-Chun) (1996)
- Advisor: L. Rafael Reif
- Department of Electrical Engineering and Computer Science
Relaxation effects in MOS devices due to tunnel exchange with near-interface oxide traps
Tewksbury, Theodore L. (Theodore Locke) (1992)
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- Department of Electrical Engineering and Computer Science
Dynamics of the kink effect in InAlAs/InGaAs/InP HEMTs
Ernst, Alexander N. (Alexander Nicolai) (1997)
- Advisor: Jesus A. del Alamo
- Department of Electrical Engineering and Computer Science
- Advisor: Jesús A. del Alamo
- Department of Electrical Engineering and Computer Science
Advanced technologies for improving high frequency performance of AlGaN/GaN high electron mobility transistors
Chung, Jinwook W. (Jinwook Will) (2008)
- Advisor: Tomás Palacios
- Department of Electrical Engineering and Computer Science
- Advisor: James E. Chung
- Department of Electrical Engineering and Computer Science
Hole mobility in strained Ge/relaxed SiGe with a High-k/metal gate stack
Polyzoeva, Evelina Aleksandrova (2011)
- Advisor: Dimitri A. Antoniadis
- Department of Electrical Engineering and Computer Science
- Advisor: Tomás Palacios
- Department of Electrical Engineering and Computer Science