Theses most similar to Effect of varying gate-drain distance on the RF power performance of pseudomorphic high electron mobility transistors (Wong, Melinda F; 2005) read it

Low-noise preamplifier for capacitive sensors

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Deeply scaled CMOS for RF power applications

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On the methodology of assessing hot-carrier reliability of analog circuits

Le, Huy X. P (1999)

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RF power CMOS

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Investigation of noise sources in scaled CMOS field-effect transistors

Sepke, Todd C. (Todd Christopher), 1975- (2002)

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  • Department of Electrical Engineering and Computer Science
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