Theses most similar to Hot-carrier reliability of MOSFETs at room and cryogenic temperature (Kim, SeokWon Abraham, 1970-; 1999) read it
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- Department of Electrical Engineering and Computer Science
- Advisor: James E. Chung
- Department of Electrical Engineering and Computer Science
Reliability and 1/f noise properties of MOSFETs with nitrided oxide gate dielectrics
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- Department of Electrical Engineering and Computer Science
Dynamics of the kink effect in InAlAs/InGaAs/InP HEMTs
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- Advisor: Jesus A. del Alamo
- Department of Electrical Engineering and Computer Science
- Advisor: Dimitri A. Antoniadis
- Department of Electrical Engineering and Computer Science
Hole mobility in strained Ge/relaxed SiGe with a High-k/metal gate stack
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- Advisor: Dimitri A. Antoniadis
- Department of Electrical Engineering and Computer Science
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- Department of Electrical Engineering and Computer Science
Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors
Mertens, Samuel D. (Samuel David), 1975- (1999)
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- Department of Electrical Engineering and Computer Science
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- Department of Electrical Engineering and Computer Science
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- Advisor: Dimitri A. Antoniadis
- Department of Electrical Engineering and Computer Science