Theses most similar to Bias temperature instability (BTI) in GaN MOSFETs (Guo, Alex; 2016) read it

Degradation mechanisms of GaN high electron mobility transistors

Joh, Jungwoo (2007)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Electrical degradation mechanisms of RF power GaAs PHEMTs

Villanueva, Anita A. (Anita Ariel), 1978- (2007)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Dynamics of the kink effect in InAlAs/InGaAs/InP HEMTs

Ernst, Alexander N. (Alexander Nicolai) (1997)

  • Advisor: Jesus A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Hot-carrier reliability assessment in CMOS digital integrated circuits

Jiang, Wenjie, 1963- (1998)

  • Advisor: James E. Chung
  • Department of Electrical Engineering and Computer Science
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Reliability of GaN high electron mobility transistors on silicon substrates

Demirtas, Sefa (2009)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Physics of electrical degradation in GaN high electron mobility transistors

Joh, Jungwoo (2009)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Electrical degradation of InAlAs/InGaAs metamorphic high electron mobility transistors

Mertens, Samuel D. (Samuel David), 1975- (1999)

  • Advisors: Jesús A. del Alamo; Lawrence G. Studebaker
  • Department of Electrical Engineering and Computer Science
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Electrical reliability of RF power GaAs PHEMTs

Villanueva, Anita A. (Anita Ariel), 1978- (2003)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Degradation of GaN High Electron Mobility Transistors under high-power and high-temperature stress

Computer Science, fl. 2014-; Wu, Yufei. Department of Electrical Engineerin (2014)

  • Advisor: Jesus A. del Alamo
  • Department of Electrical Engineering and Computer Science
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Dynamic ON-resistance in high voltage GaN field-effect-transistors

Jin, Donghyun (2014)

  • Advisor: Jesús A. del Alamo
  • Department of Electrical Engineering and Computer Science
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